In the heart of every modern electronic device lies a silicon chip, built through a manufacturing process so precise that even a microscopic defect can...

In the heart of every modern electronic device lies a silicon chip, built through a manufacturing process so precise that even a microscopic defect can determine success or failure. As semiconductor devices grow more complex, reliably detecting and classifying defects has become a critical bottleneck. Historically, chipmakers have relied on convolutional neural networks (CNNs) to automate…

Source